Single Molecule Emission Characteristics in Near-Field Microscopy
نویسندگان
چکیده
منابع مشابه
Near-field effects in single molecule emission.
We present the first experimental proof of the influence of a nearby nano-sized metal object on the angular photon emission by a single molecule. A novel angular sensitive detection scheme is implemented in an existing near-field scanning optical microscope (NSOM). The positioning accuracy ( approximately 1 nm) of the NSOM allows a systematic investigation of the intensity ratio between two dif...
متن کاملSingle molecule mapping of the optical field distribution of probes for near-field microscopy.
The most difficult task in near-field scanning optical microscopy (NSOM) is to make a high quality subwavelength aperture probe. Recently, we have developed high definition NSOM probes by focused ion beam (FIB) milling. These probes have a higher brightness, better polarization characteristics, better aperture definition and a flatter end face than conventional NSOM probes. We have determined t...
متن کاملSingle-Molecule Single-Nanoparticle Microscopy
Based on a scanning near-field optical microscope (SNOM) we present measurements on the optical interaction of a single molecule and a single gold nanoparticle. The phenomena of field enhancement, emission quenching and fluorescence enhancement are studied with outstanding control over all key parameters. We have attached a single gold nanoparticle to the extremity of a pulled glass fiber tip a...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Physical Review Letters
سال: 1995
ISSN: 0031-9007,1079-7114
DOI: 10.1103/physrevlett.75.4772